NIST X-Ray Photoelectron Spectroscopy Database: Version 4.0
Now available via the web as a campus-wide site license, the NIST X-ray Photoelectron Spectroscopy (XPS) Database gives easy access to the energies of many photoelectron and Auger-electron spectral lines. Resulting from a critical evaluation of the published literature, the database contains over 29,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines. A highly interactive program allows the user to search by element, line type, line energy, and many other variables. Users can easily identify unknown measured lines by matching to previous measurements.
Categorized as: New resourcesBoth comments and pings are currently closed.