General information about x-ray diffraction and its applications:

1. P.F. Fewster, X-ray Scattering from Semiconductors (Imperial College Press, London, 2000).

2. D.K. Bowen and B.K. Tanner, High Resolution X-ray Diffractometry and Topography (Taylor & Francis Ltd, London, 1998).

3. R.L. Snyder, J. Fiala and H.J. Bunge Defect and Microstructure Analysis by Diffraction (Oxford Univeristy Press, New York, 1999).

4. B.D. Cullity and S.R. Stock, Elements of X-ray Diffraction (Prentice Hall, New Jersey, 2001).

5. B.E. Warren, X-ray Diffraction (Dover Publications Inc., New York, 1990).

6. C. Hammond, The Basics of Crystallography and Diffraction (Oxford University Press, New York, 2001).

7. C. Giacovazzo, Fundamentals of Crystallography (Oxford University Press, Oxford, 1992).

8. R. Jenkins and R.L. Snyder, Introduction to X-ray Powder Diffractometry (J. Wiley & Sons Inc., New York, 1996).

9. H.P. Klug and L.E. Alexander, X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials (J. Wiley & Sons Inc., New York, 1974).

10. U.F. Kocks, C.N. Tomé and H.-R. Wenk Texture and Anisotropy (Cambridge University Press, Cambridge, 1998).

11. I.C. Noyan and J.B. Cohen Residual Stress (Springer-Verlag, New York, 1986).

12. The Rietveld Method, edited by R.A. Young (Oxford University Press, New York, 1993).

13. L.S. Zevin and G. Kimmel Quantitative X-ray Diffractometry (Springer-Verlag, New York, 1995).