PROFESSIONAL ACTIVITIES:

Senior Member, IEEE.

Organizing Committee Member and Innovative Practices Track Chair, IEEE VLSI Test Symposium, 2006, 2007, 2008.

International Advisory Panel, IEEE International Conference on Intelligent and Advanced Systems, 2007.

Selection Committee for the 2006-2007 ACM Outstanding PhD Dissertation in EDA.

Program Co-Chair, IEEE SELSE Workshop, 2007.

General Co-Chair and Co-Founder, IEEE System Effects of logic Soft Errors Workshop, 2005, 2006.

Special session organizer, IEEE International Test Conference, 2005.

General Co-Chair, CRC-IEEE Pacific Northwest Test Workshop, 2003, 2004, 2005.

Panelist, National Science Foundation, 2004, 2005, 2007.

Membership Chair, IEEE Test Technology Technical Council, 2004.

Panels Chair, IEEE Test Resource Partitioning Workshop, 2003, 2004.

Registration Chair, IEEE Intl. Conf. on Dependable Systems and Networks, 2003.

Vice General Chair, IEEE Pacific Northwest Test Workshop, 2002.

Panel Organizer, IEEE VLSI Test Symp., 2001, 2002, 2003, 2005.

IEEE Stanford EE/CS Research Journal Committee, 2004.

Session chair: IEEE International Test Conference, IEEE Defect-Based Test Workshop, IEEE Pacific Northwest Test Workshop.

Program Committees:

International Test Conference, 2006, 2007; IEEE International Conference on Dependable Systems and Networks (DSN), 2007, 2008; IEEE International Reliability Physics Symposium, 2008; IEEE VLSI Test Symposium, 2004, 2005; IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2005, 2006, 2007; International Conference on Computer Design (ICCD), 2006, 2007; IEEE Field Programmable Custom Computing Machines (FCCM), 2007-2008; IFIP SoC-VLSI 2007; International Conference on Supercomputing, 2006, 2008; ACM Great Lakes Symposium on VLSI, 2006; International Conference on VLSI Design, 2006; Design Automation and Test in Europe (DATE), 2004; IEEE Intl. On-line Test Symp., 2002-2008; International Conference on Parallel and Distributed Systems (ICPADS), 2006; ACM SIGDA PhD Forum, 2006, 2007; International Conference on Application-Specific Systems, Architectures and Processors (ASAP), 2006, 2007; International Conference on Embedded Software and Systems, 2005; IEEE North Atlantic Test Workshop, 2003-2007; IEEE International Test Synthesis Workshop, 2004-2008; ADCOM, 2003; Evaluating and Architecting System Dependability Workshop, 2002.

Reviewer for major journals and conferences: IEEE Trans. CAD, IEEE Trans. VLSI, IEEE Trans. Computers, ACM Trans. Electronic Design Automation, Intl. Test Conf., IEEE VLSI Test Symp., Design Automation Conf., IEEE Intl. Conf. Computer-Aided Design, and several others.