Agilent SPM
The Agilent 5500 SPM is a multiple-user research system for Scanning Probe Microscopy (SPM) and Atomic Force Microscope (AFM). The 5500 SPM provides a wealth of unique technological features including a multi-purpose low coherence scanners, along with a 1 nA/V current sensing CSAFM nose-cone, with a Triple lock-in AC mode controller. Also include is a STM 10um Scanner and precision temperature controlled , and a liquid cell sample plates. The Agilent 5500 SPM offers features lithography and nanomanipulation software for research in materials science, polymers, nanolithography and general surface characterization. The combination of hardware allows for numerous characterization techniques including Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Contact mode AFM, Intermittent Contact AFM, Current Sensing Mode (CSAFM), Force Modulation Microscopy (FM), Lateral Force Microscopy (LFM), Dynamic Lateral Force Microscopy (DLFM), Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM) and Kelvin Force Microscopy (KFM)