Thursday May 3rd, 2:30PM
Ginzton AP299
*** Bring samples that you would like to analyze ***
The LEXT, Olympus' confocal laser-scanning microscope, offers high resolution and high magnification imaging with little or no sample preparation. It offers magnification up to 14,400X with 120 nm lateral resolution and 10 nm Z resolution using a 408 nm laser. The LEXT provides standard white light microscope observation including brightfield, darkfield and Nomarski DIC and laser observation in non-confocal, confocal and confocal DIC modes. It can perform distance, height and roughness measurements with an X repeatability of less than 0.02 microns and a Z repeatability of less than 0.05 + 0.001L microns. The LEXT is considered a bridge tool between white light microscopes and scanning electron microscopes. There is also an IR version of the LEXT that uses a 1320 nm laser to image through silicon and a few other materials. It offers a resolution of 700 nm. The LEXT IR has an XY repeatability of 0.05 microns or less and a Z repeatability of 0.1 microns or less.
Here is a website link with more information about the LEXT: http://www.olympusmicroimaging.com/index.cfm/page/products.index.cfm/cid/1085/navid/206/parentid/182
The presentation will be followed by a demonstration of the laser-scanning microscope. You are welcome to bring samples that you would like to analyze.
Presentation and demonstration by:
Lee Bazella
Territory Manager - San Jose, CA
Micro-Imaging Division
Olympus Industrial America
Refreshments will be provided.