Wim J van der Linden holds degrees in Psychology and Sociology from the University of Utrecht and a PhD in psychometrics from the University of Amsterdam, The Netherlands. After a long career as Professor of Measurement and Data Analysis, at the University of Twente, Netherlands, he accepted the position of Chief Research Scientist at CTB/McGraw-Hill, Monterey, CA, in 2008. His research interests include test theory, computerized adaptive testing, optimal test assembly, test equating, modeling response times on test items, and decision theory and its application to problems of educational decision making. His publications have appeared in all major international journals. He is co-editor of two published volumes: Handbook of Modern Item Response Theory (New York: Springer, 1997; with R. K. Hambleton) and Computerized Adaptive Testing: Theory and Applications (Boston: Kluwer, 2001; with C. A. W. Glas). His latest book is Linear Models for Optimal Test Design published by Springer-Verlag in 2005. Currently, he is currently working on Introduction to Test Theory and its Applications, also to be published by Springer. Wim van der Linden has served on the editorial boards of Applied Psychological Measurement, Journal of Educational Measurement, Psychometrika, European Review of Applied Psychology, Dutch Journal of Education, Dutch Journal of Educational Research, and International Journal of Testing, is a co-editor for the Springer Series on Statistics for Social and Behavioral Sciences, and has been a member of boards and committees of numerous national and international professional organizations. He is also a former President of the Psychometric Society, Fellow of the Center for Advanced Study in the Behavioral Sciences, Stanford, CA, and a recipient of the ATP and NCME Career Achievement Awards for his work on educational measurement.

Paper to present:  Conceptual Issues in Response-Time Modeling-Wim J van der Linden