Tobi Beetz is the Associate Director of the
Tobi received his Ph.D. in Physics from Stony Brook University after transferring from the Universität Würzburg. His thesis research focused on high-resolution x-ray imaging with and without lenses, as well as x-ray radiation damage studies. He spent two years as a Research Associate at the Center for Functional Nanomaterials at Brookhaven National Laboratory where he studied carbon nanotubes and other nanomaterials using advanced electron imaging techniques. Before joining the CPN, Tobi spent two years at Xradia, Inc. where he led a team to develop novel high-resolution x-ray microscopes for the investigation of nanoscale objects.
Contact Information
Tobias Beetz
Center for Probing the Nanoscale
476
Office Phone: (650) 723-4490
Fax: (650) 736-2942
Email: tobi@stanford.edu
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