Scanning Microwave Impedance Microscope
Currently nano-scale imaging techniques, such as the Scanning Tunneling Microscope, are limited to conducting surfaces. A new technique which uses evanescent microwaves to probe a surface promises to directly image the dielectric constant. In this way, both insulators and metals could be probed on the nano-scale.
AFM-based system: Room-temperature to 200°C
Cryogenic system: 2-300K / 9T
